New growth mode through decorated twin boundaries

Physical Review Letters

Volumn 96, Issue 11, 2006, Pages

  Bleikamp, Sebastian ^a   Thoma, Arne ^a   Polop, Celia ^a   Pirug, Gerhard ^b   Linke, Udo ^b   Michely, Thomas ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT KINETICS; GROWTH MODE; TWIN BOUNDARIES; TWIN FAULTS; TWINNED STACKING;

DEFECTS; IRIDIUM; LOW ENERGY ELECTRON DIFFRACTION; PHASE TRANSITIONS; ROUGHNESS MEASUREMENT; SCANNING TUNNELING MICROSCOPY; STACKING FAULTS; TWINNING;

THIN FILMS;

EID: 33645080168     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.96.115503     Document Type: Article

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