An examination of the spectra of the "kick-out" pulses for a proposed sampling oscilloscope calibration method

IEEE Transactions on Instrumentation and Measurement

Volumn 50, Issue 5, 2001, Pages 1221-1223

  Paulter, Nicholas G ^b   Larson, D R ^a,b  

^a IEEE

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Frequency spectra; Kick out pulse; Nose to nose calibration method; Offset voltage; Pulse metrology; Sampler calibration

Indexed keywords

DIODES; ELECTRIC POTENTIAL; ELECTRIC WAVEFORMS; FOURIER TRANSFORMS; FREQUENCIES; NONLINEAR SYSTEMS; SPURIOUS SIGNAL NOISE;

KICK-OUT PULSE; NOSE-TO-NOSE CALIBRATION METHOD; OFFSET VOLTAGE; PULSE METROLOGY; SAMPLER CALIBRATION METHOD;

CATHODE RAY OSCILLOSCOPES;

EID: 0035483243     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.963187     Document Type: Article

References (6)

1. Characterizing high-speed oscilloscopes
2. Individual characterization of broadband sampling oscilloscopes with a nose-to-nose calibration procedure
3. Broadband sampling oscilloscope characterization with the 'nose-to-nose' calibration procedure: A theoretical and practical analysis
4. Calibration of fast sampling oscilloscopes
5. Electrooptic sampling of low temperature GaAs pulse generators for oscilloscope calibration
6. The effect of offset voltage on the kick-out pulses used in the nose-to-nose sampler impulse response characterization method