-
1
-
-
27644542973
-
Uncertainty of the NIST electro-optic sampling system
-
NIST, Boulder, CO
-
D. Williams, P. Hale, T. Clement, and C.-M. Wang, "Uncertainty of the NIST electro-optic sampling system," NIST, Boulder, CO, Tech. Note 1535, 2005.
-
(2005)
Tech. Note
, pp. 1535
-
-
Williams, D.1
Hale, P.2
Clement, T.3
Wang, C.-M.4
-
2
-
-
0036920755
-
Calibrated photoreceiver response to 110 GHz
-
Glasgow, U.K., Nov. 10-14
-
T. S. Clement, D. F. Williams, P. D. Hale, and J. M. Morgan, "Calibrated photoreceiver response to 110 GHz," in 15th Annu. IEEE Lasers Electro-Opt. Soc. Meeting, Glasgow, U.K., Nov. 10-14, 2002, pp. 877-878.
-
(2002)
15th Annu. IEEE Lasers Electro-Opt. Soc. Meeting
, pp. 877-878
-
-
Clement, T.S.1
Williams, D.F.2
Hale, P.D.3
Morgan, J.M.4
-
3
-
-
0035686249
-
Calibrating electro-optic sampling systems
-
May
-
D. F. Williams, P. D. Hale, T. S. Clement, and J. M. Morgan, "Calibrating electro-optic sampling systems," in IEEE MTT-S Int. Microw. Symp. Dig., May 2001, vol. 1473, pp. 1527-1530.
-
(2001)
IEEE MTT-S Int. Microw. Symp. Dig.
, vol.1473
, pp. 1527-1530
-
-
Williams, D.F.1
Hale, P.D.2
Clement, T.S.3
Morgan, J.M.4
-
4
-
-
33747259573
-
Calibration of sampling oscilloscopes with high-speed photodiodes
-
Aug.
-
T. S. Clement, P. D. Hale, D. F. Williams, C. M. Wang, A. Dienstfrey, and D. A. Keenan, "Calibration of sampling oscilloscopes with high-speed photodiodes," IEEE Trans. Microw. Theory Tech., vol. 54, no. 8, pp. 3173-3181, Aug. 2006.
-
(2006)
IEEE Trans. Microw. Theory Tech.
, vol.54
, Issue.8
, pp. 3173-3181
-
-
Clement, T.S.1
Hale, P.D.2
Williams, D.F.3
Wang, C.M.4
Dienstfrey, A.5
Keenan, D.A.6
-
5
-
-
84954189067
-
Analysis of interconnection networks and mismatch in the nose-to-nose calibration
-
Jun.
-
D. C. Degroot, P. D. Hale, M. Vanden Bossche, F. Verbyst, and J. Verspecht, "Analysis of interconnection networks and mismatch in the nose-to-nose calibration," in ARFTG Conf. Dig., Jun. 2000, vol. 55, pp. 116-121.
-
(2000)
ARFTG Conf. Dig.
, vol.55
, pp. 116-121
-
-
Degroot, D.C.1
Hale, P.D.2
Vanden Bossche, M.3
Verbyst, F.4
Verspecht, J.5
-
6
-
-
84954134986
-
Estimating magnitude and phase response of a 50 GHz sampling oscilloscope using the 'nose-to-nose' method
-
Jun.
-
P. D. Hale, T. S. Clement, K. J. Coakley, C. M. Wang, D. C. DeGroot, and A. P. Verdoni, "Estimating magnitude and phase response of a 50 GHz sampling oscilloscope using the 'nose-to-nose' method," in 55th ARFTG Conf. Dig., Jun. 2000, pp. 335-342.
-
(2000)
55th ARFTG Conf. Dig.
, pp. 335-342
-
-
Hale, P.D.1
Clement, T.S.2
Coakley, K.J.3
Wang, C.M.4
Degroot, D.C.5
Verdoni, A.P.6
-
8
-
-
0026908842
-
On the use of the Hilbert transform for processing measured CW data
-
Aug.
-
F. M. Tesche, "On the use of the Hilbert transform for processing measured CW data," IEEE Trans. Electromagn. Compat., vol. 34, no. 3, pp. 259-266, Aug. 1992.
-
(1992)
IEEE Trans. Electromagn. Compat.
, vol.34
, Issue.3
, pp. 259-266
-
-
Tesche, F.M.1
-
9
-
-
0035472967
-
Analytic continuation, singular-value expansions, and Kramers-Kronig analysis
-
A. Dienstfrey and L. Greengard, "Analytic continuation, singular-value expansions, and Kramers-Kronig analysis," Inverse Problems, vol. 17, pp. 1307-1320, 2001.
-
(2001)
Inverse Problems
, vol.17
, pp. 1307-1320
-
-
Dienstfrey, A.1
Greengard, L.2
-
10
-
-
0035205727
-
Interpretation and identification of minimum-phase reflection coefficients
-
Dec.
-
J. G. McDaniel and C. L. Clarke, "Interpretation and identification of minimum-phase reflection coefficients," J. Acoust. Soc. Amer., vol. 110, no. 6, pp. 3003-3010, Dec. 2001.
-
(2001)
J. Acoust. Soc. Amer.
, vol.110
, Issue.6
, pp. 3003-3010
-
-
McDaniel, J.G.1
Clarke, C.L.2
-
11
-
-
0242609097
-
Finite-bandwidth effects on the causal prediction of ultrasound attenuation of the power law form
-
Nov.
-
J. Mobley, K. R. Waters, and J. G. Miller, "Finite-bandwidth effects on the causal prediction of ultrasound attenuation of the power law form," J. Acoust. Soc. Amer., vol. 114, no. 5, pp. 2782-2790, Nov. 2003.
-
(2003)
J. Acoust. Soc. Amer.
, vol.114
, Issue.5
, pp. 2782-2790
-
-
Mobley, J.1
Waters, K.R.2
Miller, J.G.3
-
13
-
-
0022697185
-
General properties of the transfer function of stroboscopic converters
-
M. Efimchik and B. Levitas, "General properties of the transfer function of stroboscopic converters," Sov. J. Commun. Technol. Electron., vol. 31, no. 4, pp. 110-119, 1986.
-
(1986)
Sov. J. Commun. Technol. Electron.
, vol.31
, Issue.4
, pp. 110-119
-
-
Efimchik, M.1
Levitas, B.2
-
14
-
-
0000147034
-
A general waveguide theory
-
R. B. Marks and D. F. Williams, "A general waveguide theory," J. Res. Nat. Inst. Stand. Technol., vol. 97, no. 5, pp. 533-562, 1992.
-
(1992)
J. Res. Nat. Inst. Stand. Technol.
, vol.97
, Issue.5
, pp. 533-562
-
-
Marks, R.B.1
Williams, D.F.2
-
15
-
-
0033314268
-
On the determination of dynamic errors for rise time measurement with an oscilloscope
-
Dec.
-
C. Mittermayer and A. Steininger, "On the determination of dynamic errors for rise time measurement with an oscilloscope," IEEE Trans. Instrum. Meas., vol. 48, no. 6, pp. 1103-1107, Dec. 1999.
-
(1999)
IEEE Trans. Instrum. Meas.
, vol.48
, Issue.6
, pp. 1103-1107
-
-
Mittermayer, C.1
Steininger, A.2
-
16
-
-
0003498504
-
-
New York: Academic
-
I. S. Gradshteyn and I. M. Ryzhik, Table of Integrals, Series, and Products, 5th ed. New York: Academic, 1994.
-
(1994)
Table of Integrals, Series, and Products, 5th Ed.
-
-
Gradshteyn, I.S.1
Ryzhik, I.M.2
-
18
-
-
0003492094
-
-
BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, and OIML
-
"Guide to the Expression of Uncertainty in Measurement," BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, and OIML, 1993, pp. 1-101.
-
(1993)
Guide to the Expression of Uncertainty in Measurement
, pp. 1-101
-
-
-
19
-
-
0016035562
-
De-embedding and unterminating
-
Mar.
-
R. F. Bauer and P. Penfield, "De-embedding and unterminating," IEEE Trans. Microw. Theory Tech., vol. MTT-22, no. 3, pp. 282-288, Mar. 1974.
-
(1974)
IEEE Trans. Microw. Theory Tech.
, vol.MTT-22
, Issue.3
, pp. 282-288
-
-
Bauer, R.F.1
Penfield, P.2
-
20
-
-
31044434362
-
Covariance-based uncertainty analysis of the NIST electro-optic sampling system
-
Jan.
-
D. F. Williams, A. Lewandowski, T. S. Clement, C. M. Wang, P. D. Hale, J. M. Morgan, D. Keenan, and A. Dienstfrey, "Covariance-based uncertainty analysis of the NIST electro-optic sampling system," IEEE Trans. Microw. Theory Tech., vol. 54, no. 1, pp. 481-491, Jan. 2005.
-
(2005)
IEEE Trans. Microw. Theory Tech.
, vol.54
, Issue.1
, pp. 481-491
-
-
Williams, D.F.1
Lewandowski, A.2
Clement, T.S.3
Wang, C.M.4
Hale, P.D.5
Morgan, J.M.6
Keenan, D.7
Dienstfrey, A.8
-
22
-
-
0031258624
-
A direct calibration method for measuring equivalent source mismatch
-
Oct.
-
J. R. Juroshek, "A direct calibration method for measuring equivalent source mismatch," Microwave J., pp. 106-118, Oct. 1997.
-
(1997)
Microwave J.
, pp. 106-118
-
-
Juroshek, J.R.1
-
23
-
-
0003641574
-
-
ser. App. Math. Sci.. New York: Springer-Verlag
-
C. de Boor, A Practical Guide to Splines, ser. App. Math. Sci.. New York: Springer-Verlag, 1978, vol. 27.
-
(1978)
A Practical Guide to Splines
, vol.27
-
-
De Boor, C.1
|