Sampling oscilloscope models and calibrations

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 2003, Pages 1507-1510

  Remley, Kate A ^a   Williams, Dylan F ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; COMPUTER SIMULATION; ELECTRIC IMPEDANCE; JITTER;

SAMPLING CIRCUITS;

OSCILLOGRAPHS;

EID: 0042592955     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)

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