Calibrating photoreceiver response to 110 GHz

Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

Volumn 2, Issue , 2002, Pages 877-878

  Clement, Tracy S ^a   Williams, Dylan F ^a   Hale, Paul D ^a   Morgan, Juanita M ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; ELECTRIC FIELDS; ELECTROMAGNETIC WAVE PROPAGATION; ELECTROOPTICAL EFFECTS; FIBER LASERS; FREQUENCIES; LASER PULSES; LIGHT POLARIZATION; OPTICAL WAVEGUIDES;

COAXIAL CONNECTORS; ELECTRICAL IMPULSES; ELECTROOPTIC SAMPLING; PHOTORECEIVER;

ELECTROOPTICAL DEVICES;

EID: 0036920755     PISSN: 10928081     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. D.F. Williams, P.D. Hale, T.S. Clement, and J.M. Morgan, "Calibrating electro-optic sampling systems," Int. Microwave Symposium Digest, Phoenix, AZ, pp. 1527-1530, May 2001.
2. D. F. Williams, P. D. Hale, T. S. Clement, and J. M. Morgan, "Mismatch corrections for electro-optic sampling systems," 56th Automatic RF Techniques Group Conf. Dig., Boulder, CO, Nov. 20-Dec. 1, 2000.
3. B. H. Kolner and D. M. Bloom, "Electrooptic sampling in GaAs integrated circuits," IEEE J. Quantum Electron., vol QE-22, pp. 79-93, 1986.
4. R.F. Kaiser and D.F. Williams, "Source of Error in Coplanar-Waveguide TRL Calibrations," 54th ARFTG Conference Digest, Dec. 1-2, 1999.
5. D. F. Williams, R. B. Marks, and A. Davidson, "Comparison of On-Wafer Calibrations," 38th ARFTG Conference Digest, pp. 68-81, Dec. 1991.
6. "HP8510 Specifications and Performance Verification Analysis Software," Hewlett-Packard part number 08510-10033, Program revision A.05.00, Data revision A.05.00. The National Institute of Standards and Technology does not endorse commercial products. Similar products may work as well or better.