X-ray point- and line-projection microscopy and diffraction

Optics Communications

Volumn 265, Issue 1, 2006, Pages 18-28

  Caro, Liberato De ^a   Giannini, Cinzia ^a   Cedola, Alessia ^b   Lagomarsino, Stefano ^b   Bukreeva, Inna ^b  

^a CNR   (Italy)

^b IFN CNR   (Italy)

Author keywords

Dynamical X ray diffraction theory; X ray microscopy; X ray waveguides

Indexed keywords

BRAGG CELLS; CRYSTALLINE MATERIALS; IMAGING TECHNIQUES; OPTICAL RESOLVING POWER; X RAY DIFFRACTION;

ATOMIC SCALE; BRAGG/LAUE DIFFRACTION CONDITIONS; SUB-MICROMETRIC RESOLUTION; X-RAY SOURCES;

OPTICAL WAVEGUIDES;

EID: 33747117281     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2006.02.048     Document Type: Article

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