Polycrystalline mercuric iodide films: Deposition, properties, and detector performance

IEEE Transactions on Nuclear Science

Volumn 49 I, Issue 4, 2002, Pages 1965-1967

  Roy, U N ^b   Cui, Y ^b   Wright, G ^b   Barnett, C ^b   Burger, A ^b   Franks, L A ^c   Bell, Z W ^a,d  

^a IEEE

^b FISK UNIVERSITY   (United States)

^c Y 12 National Security Complex ^*  (United States)

^d Y 12 NATIONAL SECURITY COMPLEX   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; ELECTRIC POTENTIAL; GLASS; MERCURY COMPOUNDS; MORPHOLOGY; PARTICLE DETECTORS; PHOTOLUMINESCENCE; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY;

PARTICLE RESPONSE MEASUREMENTS;

THIN FILMS;

EID: 0036702974     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.801516     Document Type: Article

References (11)

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