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Volumn 6186, Issue , 2006, Pages

New generation of fully integrated optical microscopes on-chip: Application to confocal microscope

Author keywords

Electrostatic actuation; Glass microlens VCSEL; MOEMS; Optical feedback; Scanning Confocal Microscope; Silicon micromachining

Indexed keywords

ELECTROSTATICS; LASER BEAMS; MICROLENSES; MICROMACHINING; OPTICAL MICROSCOPY;

EID: 33746691967     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.663770     Document Type: Conference Paper
Times cited : (7)

References (15)
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    • Ranging and velocimetry signal generation in a backscatter-modulated laser diode
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    • A miniaturized SNOM sensor based on the optical feedback inside a single-mode oxide-confined vertical cavity surface-emitting laser
    • D. Heinis, C. Gorecki, C. Bringer, V. Bardinal, T. Camps, J.B. Doucet, P. Dubreuil and C. Fontaine, A miniaturized SNOM sensor based on the optical feedback inside a single-mode oxide-confined Vertical Cavity Surface-Emitting Laser, Jpn. J. Appl. Phys. Vol. 42, (2003), 1469-1471.
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  • 11
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    • Feedback-induced voltage change of vertical cavity surface emitting laser as an active detection system for miniature optical scanning probe microscopes
    • will be published
    • D. Heinis, Ch. Gorecki, S. Bargiel and B. Cretin, Feedback-induced voltage change of Vertical Cavity Surface Emitting Laser as an active detection system for miniature optical scanning probe microscopes, will be published in Optical Express.
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    • Multifunctional interferometric platform for on-chip testing the micromechanical properties of MEMS/MOEMS
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  • 13
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    • Active micro-elements testing by interferometry using time-average and quasi-stroboscopic techniques
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.