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1
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0032023440
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Silicon-micromachined scanning confocal optical microscope
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march
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Dickensheets, D.1
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Surface-micromachined confocal scanning optical microscope
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San Francisco, CA, USA, (may)
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W. Piyawattanametha, H. Toshiyoshi, J. LaCosse, M.C. Wu, Surface-Micromachined Confocal Scanning Optical Microscope, Technical Digest Series of Conference on Lasers and Electro-Optics (CLEO2000), San Francisco, CA, USA, (may 2000), 447-448.
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Piyawattanametha, W.1
Toshiyoshi, H.2
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MEMS optical scanners for microscopes
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Miyajima, H.1
Murakami, K.2
Katashiro, M.3
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0000441690
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Multispectral imaging with a confocal microendoscope
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Rouse, A.R.1
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Micromachined transmissive scanning confocal microscope
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Kwon, S.1
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21644486148
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Vertical microlens scanner for 3D imaging
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Hilton Head Isl, SC
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Kwon, S.1
Milanovic, V.2
Lee, L.P.3
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7
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Ranging and velocimetry signal generation in a backscatter-modulated laser diode
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Diode laser sensor
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A miniaturized SNOM sensor based on the optical feedback inside a single-mode oxide-confined vertical cavity surface-emitting laser
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D. Heinis, C. Gorecki, C. Bringer, V. Bardinal, T. Camps, J.B. Doucet, P. Dubreuil and C. Fontaine, A miniaturized SNOM sensor based on the optical feedback inside a single-mode oxide-confined Vertical Cavity Surface-Emitting Laser, Jpn. J. Appl. Phys. Vol. 42, (2003), 1469-1471.
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10
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33645817067
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Micromachined silicon-based probe for scanning near-field optical microscope on-chip
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S. Bargiel, D. Heinis, C. Gorecki, A. Górecka-Drzazga, J. Dziuban, M. Józwik, Micromachined silicon-based probe for scanning near-field optical microscope on-chip, Meas. Sci. Technol. Vol. 16, (2005), 1-6.
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Józwik, M.6
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11
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Feedback-induced voltage change of vertical cavity surface emitting laser as an active detection system for miniature optical scanning probe microscopes
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will be published
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D. Heinis, Ch. Gorecki, S. Bargiel and B. Cretin, Feedback-induced voltage change of Vertical Cavity Surface Emitting Laser as an active detection system for miniature optical scanning probe microscopes, will be published in Optical Express.
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Optical Express
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Heinis, D.1
Gorecki, Ch.2
Bargiel, S.3
Cretin, B.4
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12
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33746722355
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Multifunctional interferometric platform for on-chip testing the micromechanical properties of MEMS/MOEMS
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13
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Active micro-elements testing by interferometry using time-average and quasi-stroboscopic techniques
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L. Salbut, K. Patorski, M. Jozwik, J. Kacperski, Ch. Gorecki, A. Jacobelli, T. Dean, Active micro-elements testing by interferometry using time-average and quasi-stroboscopic techniques, Proc. of SPIE, Vol. 5145,(2003), 23-32.
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Gorecki, Ch.5
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Dean, T.7
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14
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0035423968
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2001 3D measurement of micromechanical devices vibration mode shapes by stroboscopic microscopic interferometry
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Petitgrand S, Yahiaoui R, Danaie K, Bosseboef A, Gilles J P, 2001 3D measurement of micromechanical devices vibration mode shapes by stroboscopic microscopic interferometry, Opt. Lasers Eng. 36(2) 77-101.
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Gilles, J.P.5
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15
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33746665687
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Optical microlenses for MOEMS
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Sevilla, Spain, SPIE
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R. Carrasco, J. Dziuban, I. Moreno, C. Gorecki, Optical microlenses for MOEMS, Proc. of Smart Sensors, Actuators, and MEMSII conference, Sevilla, Spain, SPIE Vol. 5836.
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Proc. of Smart Sensors, Actuators, and MEMSII Conference
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Carrasco, R.1
Dziuban, J.2
Moreno, I.3
Gorecki, C.4
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