Feedback-induced voltage change of a vertical-cavity surface-emitting laser as an active detection system for miniature optical scanning probe microscopes

Optics Express

Volumn 14, Issue 8, 2006, Pages 3396-3405

  Heinis, Dominique ^a   Gorecki, Christophe ^a   Bargiel, Sylwester ^a   Cretin, Bernard ^a  

^a UNIVERSITÉ DE FRANCHE COMTÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

FEEDBACK; IMAGE ANALYSIS; INDUCED CURRENTS; MICROSCOPES; OPTICAL RESOLVING POWER; PHOTODETECTORS;

CONFOCAL MICROSCOPES; FEEDBACK-INDUCED VOLTAGE; SCANNING PROBE MICROSCOPY; VERTICAL-CAVITY SURFACE EMITTING LASER;

LASER APPLICATIONS;

EID: 33645829280     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.14.003396     Document Type: Article

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