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Japanese Journal of Applied Physics, Part 2: Letters

Volumn 42, Issue 12 A, 2003, Pages

Miniaturized scanning near-field microscope sensor based on optical feedback inside a single-mode oxide-confined vertical-cavity surface-emitting laser

(8) Heinis, Dominique a Gorecki, Christophe a Bringer, Charlotte b Bardinal, Véronique b Camps, Thierry b Doucet, Jean Baptiste b Dubreuil, Pascal b Fontaine, Chantal b

a UNIVERSITÉ DE FRANCHE COMTÉ (France)

b LAAS CNRS (France)

Author keywords

Microsystems; Optical feedback; SNOM microscopy; VCSEL

Indexed keywords

BACKSCATTERING; FEEDBACK; OPTICAL DESIGN; OXIDES; PERTURBATION TECHNIQUES; SOLID STATE LASERS;

MICROSYSTEMS; OPTICAL FEEDBACK; SCANNING NEAR FIELD MICROSCOPE SENSOR; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SINGLE MODE OXIDE; VERTICAL CAVITY SURFACE EMITTING LASER;

OPTICAL SENSORS;

EID: 0742303595 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.42.l1469 Document Type: Letter

Times cited : (18)

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