Stability of carbon nanotubes under electric field studied by scanning electron microscopy

Applied Physics Letters

Volumn 79, Issue 27, 2001, Pages 4527-4529

  Wei, Yi ^a   Xie, Chenggang ^a   Dean, Kenneth A ^a   Coll, Bernard F ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035981034     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1429300     Document Type: Article

References (13)

1. See, for example, R. Saito, G. Dresselhaus, and M. S. Dresselhaus, Physical Properties of Carbon Nanotubes (Imperial College Press, London, 1998).
2. W. Zhu, G. P. Kochanski, S. Jin, and L. Seibles, J. Vac. Sci. Technol. B 14, 2011 (1996).
3. W. A. de Heer, A. Chatelain, and D. Ugarte, Science 270, 1170 (1995).
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5. J. M. Bonard, J.-P. Salvetat, T. Stöckli, W. A. de Heer, L. Forró, and A. Chotelain, Appl. Phys. Lett. 73, 918 (1998).
6. J. P. Salvetat, G. D. Briggs, J.-M. Bonard, R. R. Bacsa, A.-J. Kulik, T. Stöckli, N. A. Burnham, and L. Forró, Phys. Rev. Lett. 82, 944 (1999).
7. M.-F. Yu, T. Kowalewski, and R. S. Ruoff, Phys. Rev. Lett. 85, 1456 (2000).
8. P. Poncharal, Z. L. Wang, D. Ugarte, and W. A de Heer, Science 283, 1513 (1999).
9. K. A. Dean and B. R. Chalamala, Appl. Phys. Lett. 75, 3017 (1999).
10. B. F. Coll (unpublished).
11. K. A. Dean, T. P. Burgin, and B. R. Chalamala, Appl. Phys. Lett. 79, 1873 (2001).
12. P. J. de Pablo, S. Howell, S. Crittenden, B. Walsh, E. Graugnard, and R. Reifenberger, Appl. Phys. Lett. 75, 3941 (1999).
13. Z. L. Wang, P. Poncharal, and W. A de Heer, Microsc. Microanal. 6, 224 (2000).