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Volumn 54, Issue 7, 2006, Pages 3052-3058

Modeling techniques suitable for CAD-based design of internal matching networks of high-power RF/microwave transistors

Author keywords

Bonding wires; Computer aided design (CAD) techniques; High power RF transistors; MOS capacitors

Indexed keywords

BONDING WIRES; COMPUTER-AIDED DESIGN (CAD) TECHNIQUES; HIGH-POWER RF TRANSISTORS; INTERNAL MATCHING NETWORKS;

EID: 33746388445     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2006.877033     Document Type: Article
Times cited : (21)

References (10)
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  • 2
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  • 3
    • 27644502517 scopus 로고    scopus 로고
    • Ph.D. dissertation, Dept. Microelectron. Comput. Eng., Delft Univ. Technol., Delft, The Netherlands
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  • 4
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  • 6
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    • A wideband method for the rigorous low-impedance load-pull measurement of high-power transistors suitable for large-signal model validation
    • Boulder, CO, Dec.
    • P. Aaen, J. A. Plá, D. Bridges, and E. Shumate, "A wideband method for the rigorous low-impedance load-pull measurement of high-power transistors suitable for large-signal model validation," in Automat. RF Tech. Group Conf. Fall Dig., Boulder, CO, Dec. 2000, pp. 163-169.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.