A Wideband Method for the Rigorous Low-Impedance Loadpull Measurement of High-Power Transistors Suitable for Large-Signal Model Validation

56th ARFTG Conference Digest: Metrology and Test for RF Telecommunications, ARFTG 2000

Volumn , Issue , 2000, Pages

  Aaen, Peter ^a   Plá, Jaime ^a   Bridges, Daren ^a   Shumate, Eric ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; FIXTURES (TOOLING); POWER TRANSISTORS; SCATTERING PARAMETERS; TRANSISTORS; UNCERTAINTY ANALYSIS;

FUNDAMENTAL FREQUENCIES; HIGH-POWER TRANSISTORS; LARGE SIGNAL MODELING; LOAD-PULL MEASUREMENT; MEASUREMENT UNCERTAINTY; SECOND AND THIRD HARMONICS; SYSTEM IMPEDANCES; TIME-DOMAIN REFLECTOMETRY TECHNIQUES;

TIME DOMAIN ANALYSIS;

EID: 84960465455     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.2000.327435     Document Type: Conference Paper

References (6)

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3. D. F. Williams and R. B. Marks, "Transmission line capacitance measurement," IEEE Microwave and Guided Wave Lett., vol. 1, no. 9, pp. 243-245, Sept. 1991.
4. R. B. Marks and D. F. Williams, "Characteristic impedance determination using propagation constant measurement," IEEE Microwave and Guided Wave Lett., vol. 1, no. 6, pp. 141-143, June 1991.
5. P. H. Aaen, Short printed-circuit couplers and vias, M.A.Sc. Thesis, University of Toronto, May 1997.
6. D. Descher, "Measuring parasitic capacitance and inductance using TDR", Hewlett-Packard Journal, article 11, pp. 1-19, Aug. 1996.