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Volumn 39, Issue 13, 2006, Pages 4540-4546

Reorganization of nanopatterned polymer brushes by the AFM measurement process

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTATIONAL METHODS; MOLECULAR DYNAMICS; PHYSICAL PROPERTIES; TENSORS;

EID: 33746357876     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma0606410     Document Type: Article
Times cited : (19)

References (25)
  • 7
    • 33344475496 scopus 로고    scopus 로고
    • Advincula, R. C., Brittain, W. J., Caster, K. C., Rühe, J., Eds.; Wiley-VCH: Weinheim, Germany
    • Kaholek, M.; Lee, W.-K.; LaMattina, B.; Caster, K. C.; Zauscher, S. In Polymer Brushes; Advincula, R. C., Brittain, W. J., Caster, K. C., Rühe, J., Eds.; Wiley-VCH: Weinheim, Germany, 2004; pp 381-402.
    • (2004) Polymer Brushes , pp. 381-402
    • Kaholek, M.1    Lee, W.-K.2    LaMattina, B.3    Caster, K.C.4    Zauscher, S.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.