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Volumn 31, Issue 13, 1998, Pages 4297-4300

Direct force measurements at polymer brush surfaces by atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BLOCK COPOLYMERS; FORCE MEASUREMENT; INTERFACES (MATERIALS); POLYSTYRENES; SODIUM CHLORIDE;

EID: 0032095013     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma971571n     Document Type: Article
Times cited : (162)

References (24)
  • 9
    • 0000407069 scopus 로고    scopus 로고
    • For other AFM studies of polymer modified surfaces, see: (b) Braithwaite, G.; Howe, A.; Luckham, P. Langmuir 1996, 12, 4224. (c) Biggs, S. Langmuir 1995, 11, 156. Aime, J.; Elkaakour, Z.; Odin, C.; Bouhacina, T.; Michel, D.; Curely, J.; Dautant, A. J. Appl. Phys. 1994, 76, 754.
    • (1996) Langmuir , vol.12 , pp. 4224
    • Braithwaite, G.1    Howe, A.2    Luckham, P.3
  • 10
    • 0029235053 scopus 로고
    • For other AFM studies of polymer modified surfaces, see: (b) Braithwaite, G.; Howe, A.; Luckham, P. Langmuir 1996, 12, 4224. (c) Biggs, S. Langmuir 1995, 11, 156. Aime, J.; Elkaakour, Z.; Odin, C.; Bouhacina, T.; Michel, D.; Curely, J.; Dautant, A. J. Appl. Phys. 1994, 76, 754.
    • (1995) Langmuir , vol.11 , pp. 156
    • Biggs, S.1
  • 19
    • 0030567295 scopus 로고    scopus 로고
    • (b) Stipp, S. Langmuir 1996, 12, 1884.
    • (1996) Langmuir , vol.12 , pp. 1884
    • Stipp, S.1
  • 21
    • 85034482532 scopus 로고    scopus 로고
    • note
    • 6, implying that the surface potential of the tip should have changed from positive to negative values in this pH range.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.