Structural stability of Cu nanocrystals in SiO2 exposed to high-energy ion irradiation

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 250, Issue 1-2 SPEC. ISS., 2006, Pages 210-214

  Johannessen, B ^a   Kluth, P ^a   Glover, C J ^a   Kluth, S M ^a   Foran, G J ^b   Cookson, D J ^c   Llewellyn, D J ^a   Ridgway, M C ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

^c AUSTRALIAN SYNCHROTRON   (Australia)

Author keywords

EXAFS; Ion implantation; Nanocrystals; SAXS

Indexed keywords

ANNEALING; COPPER; CRYSTAL ATOMIC STRUCTURE; ION IMPLANTATION; METALLIC FILMS; SILICA; X RAY SCATTERING;

BULK ELEMENTAL METALS; NANOCRYSTALS; SMALL ANGLE X-RAY SCATTERING (SAXS); X-RAY ABSORPTION FINE STRUCTURE (EXAFS) SPECTROSCOPY;

NANOSTRUCTURED MATERIALS;

EID: 33746281093     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.04.112     Document Type: Article

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