Diffusion limited Cu and Au nanocrystal formation in thin film SiO 2

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 242, Issue 1-2, 2006, Pages 133-136

  Johannessen, B ^a   Kluth, P ^a   Glover, C J ^a   Foran, G J ^b   Ridgway, M C ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

Author keywords

EXAFS; Ion implantation; Nanocrystals

Indexed keywords

COPPER COMPOUNDS; GOLD COMPOUNDS; ION IMPLANTATION; RAPID THERMAL ANNEALING; SILICON COMPOUNDS; SINGLE CRYSTALS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

COORDINATION NUMBER; EXAFS; NANOCRYSTALS;

NANOSTRUCTURED MATERIALS;

EID: 28544439302     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.08.009     Document Type: Conference Paper

References (11)

1. A. Meldrum, L.A. Boatner, and C.W. White Nucl. Instr. and Meth. B 178 2001 7
2. Z. Liu, C. Lee, V. Narayan, G. Pei, and E.C. Kan IEEE Trans. Elect. Dev. 49 2002 1606
3. H. Hache, D. Ricard, and C. Flyntzanis J. Opt. Soc. Am. B 3 1986 1647
4. E.A. Stern, and P.J. Durham D.C. Koningsberger R. Prins X-ray Absorption: Principles, Applications and Techniques of EXAFS, SEXAFS and XANES 1998 Wiley New York 3
5. J.D. McBrayer, R.M. Swanson, and T.W. Sigmon J. Electrochem. Soc. 133 1986 1242
6. D.E. Sayers, and B.A. Bunker D.C. Koningsberger R. Prins X-ray Absorption: Principles, Applications and Techniques of EXAFS, SEXAFS and XANES 1998 Wiley New York 211
7. P.J. Ellis, and H. Freeman J. Synchrotron Radiat. 2 1995 190
8. M. Newville J. Synchrotron Radiat. 8 2001 322
9. A.L. Akudinov, B. Ravel, J.J. Rehr, and S.D. Conradson Phys. Rev. B 58 1998 7565
10. H.P. Klug, and L.E. Alexander X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials 1974 Wiley New York p. 618
11. M. Strobel, S. Reiss, and K.H. Heinig Nucl. Instr. and Meth. B 120 1996 216