Comparing crystallography and ferroelectric properties of a -axis oriented Bi3.25La0.75Ti3O12 versus non-c-axis oriented SrBi2Ta2O9 thin films on Si100)

Ferroelectrics

Volumn 288, Issue , 2003, Pages 287-301

  Hesse, D ^a   Lee, H N ^a   Zakharov, N D ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

Bismuth layered perovskites; Epitaxy; Ferroelectricity; Thin films

Indexed keywords

CRYSTAL STRUCTURE; FERROELECTRICITY; POLARIZATION; SUBSTRATES; THIN FILMS;

BISMUTH-LAYERED PEROVSKITES; MEMORY APPLICATIONS; REMANENT POLARIZATION;

CRYSTALLOGRAPHY;

EID: 33746280542     PISSN: 00150193     EISSN: 15635112     Source Type: Conference Proceeding    
DOI: 10.1080/00150190390211242     Document Type: Conference Paper

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