Hydrogen release in SiO2: Source sites and release mechanisms

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 250, Issue 1-2 SPEC. ISS., 2006, Pages 274-278

  Van Ginhoven, R M ^a   Hjalmarson, H P ^a   Edwards, A H ^b   Tuttle, B R ^c  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

^c BEHREND COLLEGE   (United States)

Author keywords

Amorphous silica; DFT; Hydrogen; Radiation effects; Silicon dioxide

Indexed keywords

ACTIVATION ENERGY; AMORPHOUS SILICON; HYDROGEN; MATHEMATICAL MODELS; OXYGEN; PROTONS; RADIATION EFFECTS;

AMORPHOUS SILICA; DFT; HOLE-CAPTURE; OXYGEN VACANCIES; SI-DANGLING BOND;

SILICA;

EID: 33746272586     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.04.123     Document Type: Article

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