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Volumn 2001-January, Issue , 2001, Pages 527-532
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Toward better wireload models in the presence of obstacles
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Author keywords
Convergence; Delay estimation; Electronic design automation and methodology; Parameter estimation; Path planning; Routing; System on a chip; Table lookup; Wire; Yield estimation
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Indexed keywords
APPLICATION SPECIFIC INTEGRATED CIRCUITS;
AUTOMATION;
COMPUTER AIDED DESIGN;
DESIGN;
INTEGRATED CIRCUIT DESIGN;
MICROPROCESSOR CHIPS;
MOTION PLANNING;
PARAMETER ESTIMATION;
SYSTEM-ON-CHIP;
TABLE LOOKUP;
WIRE;
CONVERGENCE;
DELAY ESTIMATION;
ELECTRONIC DESIGN AUTOMATION AND METHODOLOGIES;
ROUTING;
SYSTEM ON A CHIP;
YIELD ESTIMATION;
INTEGRATED CIRCUIT INTERCONNECTS;
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EID: 33745939461
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ASPDAC.2001.913362 Document Type: Conference Paper |
Times cited : (8)
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References (12)
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