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Volumn 80, Issue 1, 2006, Pages 155-162

Preparation and piezoelectric properties of sol-gel-derived Nb-doped PZT films for MEMS applications

Author keywords

Nb dopant; Piezoelectric properties; PZT thin films

Indexed keywords

CERAMIC MATERIALS; CRYSTALLINE MATERIALS; DIELECTRIC PROPERTIES; LEAD COMPOUNDS; MICROELECTROMECHANICAL DEVICES; NIOBIUM; PEROVSKITE; SEMICONDUCTOR DOPING; SOL-GELS; THIN FILMS;

EID: 33745737039     PISSN: 10584587     EISSN: 16078489     Source Type: Conference Proceeding    
DOI: 10.1080/10584580600657377     Document Type: Article
Times cited : (10)

References (11)
  • 2
    • 0019918407 scopus 로고
    • Effects of impurity doping in lead zirconate titanate ceramics
    • S. Takahashi, "Effects of Impurity Doping in Lead Zirconate Titanate Ceramics," Ferroelectrics 41, 277 (1982).
    • (1982) Ferroelectrics , vol.41 , pp. 277
    • Takahashi, S.1
  • 3
    • 0030164357 scopus 로고    scopus 로고
    • Process integration for nonvolatile ferroelectric: Memory fabrication
    • R. E. Jones and S. B. Desu, "Process Integration for Nonvolatile Ferroelectric: Memory Fabrication," MRS Bull. 21, 55 (1996).
    • (1996) MRS Bull. , vol.21 , pp. 55
    • Jones, R.E.1    Desu, S.B.2
  • 6
    • 0035302399 scopus 로고    scopus 로고
    • 3 electrodes prepared at low temperature
    • 3 Electrodes Prepared at Low Temperature," Jap. J. Appl. Phys. 40, 2357 (2001).
    • (2001) Jap. J. Appl. Phys. , vol.40 , pp. 2357
    • Kim, I.D.1    Kim, H.G.2
  • 10
    • 5244280905 scopus 로고    scopus 로고
    • Interferometric measurements of electric field-induced displacements in piezoelectric thin films
    • A. L. Kholkin, C. Wutchrich, D. V. Taylor, and N. Setter, "Interferometric Measurements of Electric Field-Induced Displacements in Piezoelectric Thin Films," Rev. Sci. Instr. 67, 1935 (1996).
    • (1996) Rev. Sci. Instr. , vol.67 , pp. 1935
    • Kholkin, A.L.1    Wutchrich, C.2    Taylor, D.V.3    Setter, N.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.