Characterization of highly preferred Pb(Zr,Ti)O3 thin films on La0.5Sr0.5CoO3 and LaNi0.6Co0.4O3 electrodes prepared at low temperature

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 4 A, 2001, Pages 2357-2362

  Kim, I D ^a   Kim, H G ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

Ferrroelectric properties; LNCO; Low temperature processing; LSCO; PZT

Indexed keywords

ANNEALING; COERCIVE FORCE; CURRENT DENSITY; ELECTRODES; FERROELECTRICITY; FILM GROWTH; GRAIN SIZE AND SHAPE; LANTHANUM COMPOUNDS; POLARIZATION; REMANENCE; SPUTTER DEPOSITION; SUBSTRATES; THERMAL EFFECTS; TITANIUM OXIDES;

LEAD ZIRCONATE TITANATE (PZT);

FERROELECTRIC THIN FILMS;

EID: 0035302399     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.2357     Document Type: Article

References (16)