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Volumn 315-316, Issue , 2006, Pages 775-778

A suspending abrasives and porous pad model for the analysis of lubrication in chemical mechanical polishing

Author keywords

CMP; Porous pad; Suspending abrasive

Indexed keywords

ABRASIVES; CHEMICAL MECHANICAL POLISHING; FLUID MECHANICS; NANOSTRUCTURED MATERIALS; POROSITY; POROUS MATERIALS; SLURRIES;

EID: 33745623404     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: 10.4028/0-87849-999-7.775     Document Type: Conference Paper
Times cited : (1)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.