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Volumn 2005, Issue , 2005, Pages 100-105

Self calibrating circuit design for variation tolerant VLSI systems

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC CIRCUIT PERFORMANCE; LEAKAGE SENSOR DESIGNS; PROCESS COMPENSATING DYNAMIC (PCD) CIRCUIT; TEST CHIP;

EID: 33745484581     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IOLTS.2005.63     Document Type: Conference Paper
Times cited : (33)

References (9)
  • 6
    • 4544298463 scopus 로고    scopus 로고
    • An on-die CMOS leakage current sensor for measuring process variation in sub-90nm generations
    • June
    • C.H. Kim, K. Roy, S. Hsu, R. Krishnamurthy, and S. Borkar, "An on-die CMOS leakage current sensor for measuring process variation in sub-90nm generations", Symposium on VLSI Circuits, pp. 250-251, June 2004.
    • (2004) Symposium on VLSI Circuits , pp. 250-251
    • Kim, C.H.1    Roy, K.2    Hsu, S.3    Krishnamurthy, R.4    Borkar, S.5
  • 7
    • 0032203877 scopus 로고    scopus 로고
    • A process-independent, 800-MB/s, DRAM byte-wide interface featuring command interleaving and concurrent memory operation
    • Nov.
    • M.M. Griffin, J. Zerbe, G. Tsang, M. Ching, and C.L. Portmann, "A process-independent, 800-MB/s, DRAM byte-wide interface featuring command interleaving and concurrent memory operation", IEEE Journal of Solid-State Circuits, Vol. 33, Issue 11, pp. 1741-1751, Nov. 1998.
    • (1998) IEEE Journal of Solid-state Circuits , vol.33 , Issue.11 , pp. 1741-1751
    • Griffin, M.M.1    Zerbe, J.2    Tsang, G.3    Ching, M.4    Portmann, C.L.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.