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Volumn 73, Issue 21, 2006, Pages

Point-defect recombination efficiency at grain boundaries in irradiated SiC

Author keywords

[No Author keywords available]

Indexed keywords


EID: 33745469320     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.73.214113     Document Type: Article
Times cited : (11)

References (21)
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    • Further information about the CAST code is available at the web site:
    • Further information about the CAST code is available at the web site: http://babylon.casaccia.enea.it, under the link "Connections."
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    • Tersoff, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.