-
2
-
-
0013336835
-
-
Sendai, Japan, Nov.
-
T. Wakabayashi, M. Saito, T. Hayashi, Y. Wakayama and S. Kobayashi, Extended Abstracts of IEE Japan, p. 55 (Sendai, Japan, Nov., 1996).
-
(1996)
Extended Abstracts of IEE Japan
, pp. 55
-
-
Wakabayashi, T.1
Saito, M.2
Hayashi, T.3
Wakayama, Y.4
Kobayashi, S.5
-
3
-
-
0442306834
-
-
Tokyo, Apr.
-
Y. Sakamoto, K. Takeda, T. Nonaka, T. Taira, T. Fujimoto, N. Suwa and K. Otsuka, Proc. 18th Annual Tech. Meeting Air Cleaning and Contamination Control, p. 15 (Tokyo, Apr., 2000).
-
(2000)
Proc. 18th Annual Tech. Meeting Air Cleaning and Contamination Control
, pp. 15
-
-
Sakamoto, Y.1
Takeda, K.2
Nonaka, T.3
Taira, T.4
Fujimoto, T.5
Suwa, N.6
Otsuka, K.7
-
4
-
-
0030196440
-
-
T. Takahagi, S. Shingubara, H. Sakaue, K. Hoshino and H. Yashima, Jpn. J. Appl. Phys., 35, L818(1996).
-
(1996)
Jpn. J. Appl. Phys.
, vol.35
-
-
Takahagi, T.1
Shingubara, S.2
Sakaue, H.3
Hoshino, K.4
Yashima, H.5
-
7
-
-
0037258474
-
-
C. L. Tsai, P. Roman, C. T. Tu, C. Pantano, J. Berry, E. Kamieniecki and J. Ruzyllo, J. Electrochem. Soc., 150 (2003) G39.
-
(2003)
J. Electrochem. Soc.
, vol.150
-
-
Tsai, C.L.1
Roman, P.2
Tu, C.T.3
Pantano, C.4
Berry, J.5
Kamieniecki, E.6
Ruzyllo, J.7
-
8
-
-
0037351268
-
-
N. Muenter, B. O. Kolbesen, W. Storm and T. Muller, J. Electrochem. Soc., 150, G192 (2003).
-
(2003)
J. Electrochem. Soc.
, vol.150
-
-
Muenter, N.1
Kolbesen, B.O.2
Storm, W.3
Muller, T.4
-
9
-
-
0242721653
-
-
B. O. Kolbesen, C. L. Cleays, P. Stallhofer, F. Tardif, D. K. Schroder, T. J. Shaffner M. Tajima and P. Rai-Choudhury Editors, PV, The Electrochemical Society Proceedings Series, Pennington, NJ
-
K. Saga and T. Hattori, in Analytical and Diagnostic Techniques for Semiconductor Materials, DEvices, and Processes and ALTECH 2003, B. O. Kolbesen, C. L. Cleays, P. Stallhofer, F. Tardif, D. K. Schroder, T. J. Shaffner M. Tajima and P. Rai-Choudhury Editors, PV 2003-03, P. 136, The Electrochemical Society Proceedings Series, Pennington, NJ (2003).
-
(2003)
Analytical and Diagnostic Techniques for Semiconductor Materials, DEvices, and Processes and ALTECH 2003
, vol.2003
, Issue.3
, pp. 136
-
-
Saga, K.1
Hattori, T.2
-
10
-
-
0032154614
-
-
S. D. Gendt, D. M. Knotter, K. Kenis, M. Depas, M. Meuris, P. W. Mertens and M. M. Heyns, Jpn. J. Appl. Phys, 37, 4649 (1998).
-
(1998)
Jpn. J. Appl. Phys
, vol.37
, pp. 4649
-
-
Gendt, S.D.1
Knotter, D.M.2
Kenis, K.3
Depas, M.4
Meuris, M.5
Mertens, P.W.6
Heyns, M.M.7
-
11
-
-
0033726265
-
-
F. Sugimoto, S. Okamura, T. Inokuma, Y. Kurata and S. Hasegawa, Jpn. J. Appl. Phys., 39, 2497 (2000).
-
(2000)
Jpn. J. Appl. Phys.
, vol.39
, pp. 2497
-
-
Sugimoto, F.1
Okamura, S.2
Inokuma, T.3
Kurata, Y.4
Hasegawa, S.5
-
12
-
-
0034215920
-
-
J. J. Guan, G. W. Gale, J. Bennett, Jpn. J. Appl. Phys., 39, 3947 (2000).
-
(2000)
Jpn. J. Appl. Phys.
, vol.39
, pp. 3947
-
-
Guan, J.J.1
Gale, G.W.2
Bennett, J.3
-
13
-
-
14744274149
-
-
K. Kawase, J. Tanimura, H. Kurokawa, K. Wakao, M. Inoue, H. Umeda and A Teramoto, J Electrochem. Soc., 152, G163 (2005).
-
(2005)
J Electrochem. Soc.
, vol.152
-
-
Kawase, K.1
Tanimura, J.2
Kurokawa, H.3
Wakao, K.4
Inoue, M.5
Umeda, H.6
Teramoto, A.7
-
15
-
-
0029541012
-
-
Nov.
-
M. Tamaoki, K. Nishiki, A. Shimazaki, Y. Sasaki and S. Yanagi, Proc. IEEE/SEMI Advanced Semicond. Manuf. Conf., p. 322 (Nov., 1995).
-
(1995)
Proc. IEEE/SEMI Advanced Semicond. Manuf. Conf.
, pp. 322
-
-
Tamaoki, M.1
Nishiki, K.2
Shimazaki, A.3
Sasaki, Y.4
Yanagi, S.5
-
16
-
-
27944487414
-
-
(Organic Contamination Workshop), (Munich)
-
T. Fujimoto, Proc. SEMICON Europe 2000 (Organic Contamination Workshop), p. 55, (Munich,2000)
-
(2000)
Proc. SEMICON Europe 2000
, pp. 55
-
-
Fujimoto, T.1
-
17
-
-
4644235890
-
-
M. Shimada, K. Okuyama, S. Honda and H. Habuka, Kuukiseijo, 40, 24 (2002).
-
(2002)
Kuukiseijo
, vol.40
, pp. 24
-
-
Shimada, M.1
Okuyama, K.2
Honda, S.3
Habuka, H.4
-
22
-
-
18344371373
-
-
H. Habuka, K. Suzuki, S. Okamura, M. Shimada and K. Okuyama, J. Electrochem. Soc., 152, G241 (2005).
-
(2005)
J. Electrochem. Soc.
, vol.152
-
-
Habuka, H.1
Suzuki, K.2
Okamura, S.3
Shimada, M.4
Okuyama, K.5
-
26
-
-
0037326634
-
-
H. Habuka, S. Ishiwari, H. Kato, M. Shimada and K. Okuyama, J. Electrochem. Soc., 150, G148 (2003).
-
(2003)
J. Electrochem. Soc.
, vol.150
-
-
Habuka, H.1
Ishiwari, S.2
Kato, H.3
Shimada, M.4
Okuyama, K.5
|