Silicide formation in Co/Si system investigated by depth-resolved positron annihilation and X-ray diffraction

Surface Science

Volumn 600, Issue 13, 2006, Pages 2762-2765

  Abhaya, S ^a   Venugopal Rao, G ^a   Kalavathi, S ^a   Sastry, V S ^a   Amarendra, G ^a  

^a INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

Author keywords

Cobalt silicides; Positron spectroscopy; X ray diffraction

Indexed keywords

COBALT COMPOUNDS; POSITRONS; THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS;

COBALT SILICIDES; DEPTH-RESOLVED POSITRON ANNIHILATION; POSITRON SPECTROSCOPY;

SILICON COMPOUNDS;

EID: 33745270529     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.04.043     Document Type: Article

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