Variable low energy positron beams for depth resolved defect spectroscopy in thin film structures

Current Science

Volumn 73, Issue 5, 1997, Pages 409-417

  Amarendra, G ^a   Viswanathan, B ^a   Venugopal Rao, G ^a   Parimala, J ^a   Purniah, B ^a  

^a INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001639885     PISSN: 00113891     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (27)

1. Brandt, W. and Dupasquier, A. (eds), Positron Solid State Physics, North Holland, Amsterdam, 1983.
2. Viswanathan, B. and Sundar, C. S. (eds), Positron Annihilation Studies in Materials Science, Meshap Science, 1996; See Metals, Materials and Processes, vol. 8, no. 1.
3. Viswanathan, B. and Sundar, C. S. (eds), Positron Annihilation Studies in Materials Science, Meshap Science, 1996; See Metals, Materials and Processes, vol. 8, no. 1.
4. Schultz, P. J. and Lynn, K. G., Rev. Mod. Phys., 1988, 60, 701-779.
5. Mills Jr., A. P., in ref. 1, pp. 432-509.
6. Viswanathan, B. and Amarendra, G., in Positron Annihilation and Compton Scattering (eds Sharma, B. K., Jain, P. C. and Singru, R. M.), Omega Scientific Publishers, New Delhi, 1990, p. 29-43.
7. Canter, K. F. and Mills Jr., A. P., Can. J. Phys., 1982, 60, 551-557.
8. Amarendra, G., Viswanathan, B., Venugopal Rao, G., Thomas Kutty, K. V., Purniah, B. and Gopinathan, K. P., Slow Positron Beam Techniques for Solids and Surfaces (eds Ottewitte, O. and Weiss, A. H.), AIP Conf. Proc., 1994, 303, 452-461.
9. Amarendra, G., Venugopal Rao, G. and Viswanathan, B., Indian J. Pure Appl. Phys., 1996, 34, 718-726.
10. Amarendra, G. and Viswanathan, B., in ref. 7, p. 441-451.
11. Canter, K. F., Lippel, P. H., and Nguyen, D. T., Positron Studies of Solids, Surfaces and Atoms (eds Mills Jr., A. P., Crane, W. S., and Canter, K. F.), World Scientific, Singapore, 1986, pp. 207-220.
12. Schödlbauer, D., Sperr, P., Kögel, G. and Triftshäuser, W., Nucl. Instrum. Meth. Phys. Res., 1988, B34, 258-268.
13. Amarendra, G., Canter, K. F., and Schoepf, D. C., J. Appl. Phys., 1996, 80, 4660-4664.
14. Willutzki, P., Stormer, J., Britton, D. T., Kögel, G., Sperr, P., Steindl, R., and Triftshäuser, W., in ref. 7, pp. 542-549.
15. Canter, K. F., Mills Jr, A. P. and Berko, S., Phys. Rev. Lett., 1974, 33, 7-10.
16. Mills Jr., A. P., Phys. Rev. Lett., 1978, 41, 1828-1831.
17. Parimala, J., Purniah, B., Venugopal Rao, G., Amarendra, G. and Viswanathan, B., J. Instrum. Soc. India, 1996, 26, 104-109.
18. Lynn, K. G., Phys. Rev. Lett., 1980, 44, 1330-1333.
19. 2 System, Materials Science Monographs, Elsevier Science Publishers, Amsterdam, 1988, vol. 32.
20. Bent Nielsen, Lynn, K. G., Yen-C Chen and Welch, D. O., Appl. Phys. Lett., 1987, 51, 1022-1023.
21. Asoka-Kumar, P., Lynn, K. G., and Welch, D. O., J. Appl. Phys., 1994, 76, 4935-4982.
22. Triftshäuser, W. and Kögel, G., Phys. Rev. Lett., 1982, 48, 1741-1744.
23. Venugopal Rao, G., Amarendra, G., Nair, K. G. M. and Viswanathan, B., Solid State Physics (India), 1996, C39, 150.
24. Ziegler, J. F., Biersack, J. P. and Littmark, U., The Stopping and Range of Ions in Solids, Pergamon, New York, 1985, vol. I.
25. Chen, X. M., Canter, K. F., Duke, C. B., Paton, A., Lessor, D. L. and Ford, W. K., Phys. Rev., 1993, B48, 2400-2411.
26. Weiss, A., in Surface Imaging and Visualization (ed. Hubbard, A. T.), CRC Press, NY, 1995, pp. 617-633.
27. Canter, K. F., Amarendra, G., Vasumathi, D., Wesley, S. A., Xie, R., Mills Jr., A. P., Sabatini, R. L. and Zhu, Y., Appl. Surf. Sci., 1995, 85, 339-344.