Application of phase-retrieval x-ray diffractometry to carbon doped SiGe (C)/Si (C) superlattice structures. II. High resolution reconstruction using neural network root finder technique

Journal of Applied Physics

Volumn 99, Issue 11, 2006, Pages

  Dilanian, Ruben A ^a   Nikulin, Andrei Y ^a   Darahanau, Aliaksandr V ^a   Hester, James ^b   Zaumseil, Peter ^c  

^a MONASH UNIVERSITY   (Australia)

^b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

^c IHP   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; NEURAL NETWORKS; NUMERICAL METHODS; POLYNOMIALS; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; X RAY DIFFRACTION ANALYSIS;

COMPLEX POLYNOMIALS; DIFFRACTOMETRY TECHNIQUES; ROOTS; SUPERLATTICE STRUCTURES;

SEMICONDUCTOR SUPERLATTICES;

EID: 33745266082     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2201447     Document Type: Article

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