Mechanism of charge retention loss in ferroelectric Pt/Pb(Zr,Ti)O 3/Pt capacitors and its relation to fatigue and imprint

Integrated Ferroelectrics

Volumn 53, Issue , 2003, Pages 401-411

  Yoon, Jong Gul ^a,b   Kang, B S ^b   Kim, J D ^b   Noh, T W ^b   Song, T K ^c   Lee, Y K ^d   Lee, J K ^d  

^a Suwon University   (South Korea)

^b Seoul National University   (South Korea)

^c Changwon National University   (South Korea)

^d Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

Charge retention; Fatigue; FeRAM; Imprint; Polarization dynamics

Indexed keywords

CERAMIC CAPACITORS; ELECTRIC LOSSES; ELECTROMAGNETIC WAVE POLARIZATION; FATIGUE OF MATERIALS; MAGNETIC RELAXATION; SEMICONDUCTING LEAD COMPOUNDS;

CHARGE RETENTION LOSS; POLARIZATION DYNAMICS; POLARIZATION RELAXATION; SHORT TIME RETENTION;

FERROELECTRIC DEVICES;

EID: 33745188951     PISSN: 10584587     EISSN: 16078489     Source Type: Conference Proceeding    
DOI: 10.1080/10584580390258408     Document Type: Article

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