Heterodyne double-channel polarimeter for mapping birefringence and thickness of flat glass panels

Review of Scientific Instruments

Volumn 77, Issue 5, 2006, Pages

  Protopopov, Vladimir V ^a   Cho, Sunghoon ^a   Kim, Kwangso ^a   Lee, Sukwon ^a   Kim, Hyuk ^a   Kim, Daesuk ^a  

^a SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; DATA ACQUISITION; DEPOLYMERIZATION; HETERODYNING; LASER BEAMS; LIQUID CRYSTAL DISPLAYS; PHOTOMAPPING; POLARIZATION; SOFTWARE PROTOTYPING; THICKNESS CONTROL; THICKNESS MEASUREMENT;

PARTIAL WAVES; ZEEMAN-TYPE LASER;

POLARIMETERS;

EID: 33744795178     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2202916     Document Type: Article

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