-
1
-
-
0012034597
-
A phase-sensitive technique for measuring small birefringence changes
-
H.B. Serreze, and R.B. Goldner A phase-sensitive technique for measuring small birefringence changes Rev Sci Instrum 45 1974 1613 1614
-
(1974)
Rev Sci Instrum
, vol.45
, pp. 1613-1614
-
-
Serreze, H.B.1
Goldner, R.B.2
-
2
-
-
0020800137
-
Highly sensitive instrument for measuring optical birefringence
-
Yohji Shindo, and Hiroshi Hanabusa Highly sensitive instrument for measuring optical birefringence Polym Commun 24 1983 240 244
-
(1983)
Polym Commun
, vol.24
, pp. 240-244
-
-
Yohji, S.1
Hiroshi, H.2
-
3
-
-
0031233393
-
A true phase sensitive optical heterodyne polarimeter on glucose concentration measurement
-
C.M. Feng, Y.C. Huang, J.G. Chang, M. Chang, and C. Chou A true phase sensitive optical heterodyne polarimeter on glucose concentration measurement Opt Commun 141 1997 314 321
-
(1997)
Opt Commun
, vol.141
, pp. 314-321
-
-
Feng, C.M.1
Huang, Y.C.2
Chang, J.G.3
Chang, M.4
Chou, C.5
-
4
-
-
0036865265
-
Birefringence measurements by an electro-optic modulator using a new heterodyne scheme
-
Y.L. Lo, and P.F. Hsu Birefringence measurements by an electro-optic modulator using a new heterodyne scheme Opt Eng 41 2002 2764 2767
-
(2002)
Opt Eng
, vol.41
, pp. 2764-2767
-
-
Lo, Y.L.1
Hsu, P.F.2
-
5
-
-
0036472841
-
Optical material stress measurement system using two orthogonally polarized sinusoidally intensity-modulated semiconductor lasers
-
J.R. Mackey, E. Salari, and P. Tin Optical material stress measurement system using two orthogonally polarized sinusoidally intensity-modulated semiconductor lasers Meas Sci Technol 13 2002 179 185
-
(2002)
Meas Sci Technol
, vol.13
, pp. 179-185
-
-
MacKey, J.R.1
Salari, E.2
Tin, P.3
-
6
-
-
0000247578
-
Method for measuring the retardation of a wave plate
-
L.H. Shyu, C.L. Chen, and D.C. Su Method for measuring the retardation of a wave plate Appl Opt 32 1993 4228 4230
-
(1993)
Appl Opt
, vol.32
, pp. 4228-4230
-
-
Shyu, L.H.1
Chen, C.L.2
Su, D.C.3
-
7
-
-
0001302923
-
A new instrument for measuring both the magnitude and angle of low level birefringence
-
B.L. Wang, and T.C. Oakberg A new instrument for measuring both the magnitude and angle of low level birefringence Rev Sci Instrum 70 1999 3847 3854
-
(1999)
Rev Sci Instrum
, vol.70
, pp. 3847-3854
-
-
Wang, B.L.1
Oakberg, T.C.2
-
8
-
-
0001159455
-
Birefringence imagining with imperfect benches: Application to large-scale birefringence measurements
-
G.D. Villéle, and V. Loriette Birefringence imagining with imperfect benches application to large-scale birefringence measurements Appl Opt 39 2000 3864 3874
-
(2000)
Appl Opt
, vol.39
, pp. 3864-3874
-
-
Villéle, G.D.1
Loriette, V.2
-
9
-
-
0035649040
-
Near-field scanning optical microscope based on fast birefringence measurements
-
S. Ohkubo, and N. Umeda Near-field scanning optical microscope based on fast birefringence measurements Sensors Mater 13 2001 433 443
-
(2001)
Sensors Mater
, vol.13
, pp. 433-443
-
-
Ohkubo, S.1
Umeda, N.2
-
10
-
-
1942519267
-
Simultaneous absolute measurements in principal angle and phase retardation using new common-path heterodyne interferometer
-
Y.L. Lo, C.H. Lai, J.F. Lin, and P.F. Hsu Simultaneous absolute measurements in principal angle and phase retardation using new common-path heterodyne interferometer Appl Opt 43 2004 2013 2022
-
(2004)
Appl Opt
, vol.43
, pp. 2013-2022
-
-
Lo, Y.L.1
Lai, C.H.2
Lin, J.F.3
Hsu, P.F.4
-
11
-
-
2542476958
-
A compact circular heterodyne interferometer for the simultaneous measurement of variation in the magnitude of phase retardation and the principal angle
-
S.Y. Lee, J.F. Lin, and Y.L. Lo A compact circular heterodyne interferometer for the simultaneous measurement of variation in the magnitude of phase retardation and the principal angle Meas Sci Technol 15 2004 978 982
-
(2004)
Meas Sci Technol
, vol.15
, pp. 978-982
-
-
Lee, S.Y.1
Lin, J.F.2
Lo, Y.L.3
-
12
-
-
84975578805
-
Elliptical polarization and nonorthogonality of stabilized Zeeman laser output
-
Y. Xie, and Y.Z. Wu Elliptical polarization and nonorthogonality of stabilized Zeeman laser output Appl Opt 28 1989 2043 2046
-
(1989)
Appl Opt
, vol.28
, pp. 2043-2046
-
-
Xie, Y.1
Wu, Y.Z.2
-
13
-
-
84975646207
-
Zeeman laser Interferometer errors for high-precision measurements
-
Y. Xie, and Y.Z. Wu Zeeman laser Interferometer errors for high-precision measurements Appl Opt 31 1993 881 884
-
(1993)
Appl Opt
, vol.31
, pp. 881-884
-
-
Xie, Y.1
Wu, Y.Z.2
-
14
-
-
0027676980
-
Importance of rotational beam alignment in the generation of second harmonic errors in laser heterodyne interferometry
-
J.M. De Fretias, and M.A. Player Importance of rotational beam alignment in the generation of second harmonic errors in laser heterodyne interferometry Meas Sci Technol 4 1993 1173 1176
-
(1993)
Meas Sci Technol
, vol.4
, pp. 1173-1176
-
-
De Fretias, J.M.1
Player, M.A.2
-
15
-
-
0025022793
-
Optical sources of nonlinearity in heterodyne interferometers
-
A.E. Rosenbluth, and N. Bobroff Optical sources of nonlinearity in heterodyne interferometers Precis Eng 12 1990 7 11
-
(1990)
Precis Eng
, vol.12
, pp. 7-11
-
-
Rosenbluth, A.E.1
Bobroff, N.2
-
16
-
-
0002674964
-
Investigation and compensation of the nonlinearity of heterodyne interferometers
-
W. Hou, and G. Wilkening Investigation and compensation of the nonlinearity of heterodyne interferometers Precis Eng 14 1992 91 98
-
(1992)
Precis Eng
, vol.14
, pp. 91-98
-
-
Hou, W.1
Wilkening, G.2
-
17
-
-
0027662910
-
Recent advances in displacement measuring interferometry
-
N. Bobroff Recent advances in displacement measuring interferometry Meas Sci Technol 4 1993 907 926
-
(1993)
Meas Sci Technol
, vol.4
, pp. 907-926
-
-
Bobroff, N.1
-
18
-
-
0002086653
-
Nonlinearity in measurements of length by optical interferometry
-
C.M. Wu, and C.S. Su Nonlinearity in measurements of length by optical interferometry Meas Sci Technol 7 1996 62 68
-
(1996)
Meas Sci Technol
, vol.7
, pp. 62-68
-
-
Wu, C.M.1
Su, C.S.2
-
19
-
-
0036764660
-
Polarization mixing error reduction in a two-beam interferometer
-
Y. Bitou Polarization mixing error reduction in a two-beam interferometer Opt Rev 9 2002 227 229
-
(2002)
Opt Rev
, vol.9
, pp. 227-229
-
-
Bitou, Y.1
-
20
-
-
0036986733
-
Nonlinear error by orientation and elliptical polarization in two-beam interferometer
-
H. Zhao, and G. Zhang Nonlinear error by orientation and elliptical polarization in two-beam interferometer Opt Eng 41 2002 3204 3208
-
(2002)
Opt Eng
, vol.41
, pp. 3204-3208
-
-
Zhao, H.1
Zhang, G.2
-
21
-
-
0036279537
-
Symmetrically coated pellicle beam splitters for dual quarter-wave retardation in reflection and transmission
-
R.M.A. Azzam, and F.A. Mahmoud Symmetrically coated pellicle beam splitters for dual quarter-wave retardation in reflection and transmission Appl Opt 41 2002 235 238
-
(2002)
Appl Opt
, vol.41
, pp. 235-238
-
-
Azzam, R.M.A.1
Mahmoud, F.A.2
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