Nanowire growth and dopants studied by cross-sectional scanning tunnelling microscopy

Nanotechnology

Volumn 17, Issue 11, 2006, Pages

  Mikkelsen, Anders ^a   Sköld, Niklas ^a   Ouattara, Lassana ^a   Lundgren, Edvin ^a  

^a LUND UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC; CRYSTALLINE MATERIALS; DEFECTS; DOPING (ADDITIVES); GROWTH (MATERIALS); SCANNING TUNNELING MICROSCOPY; SUBSTRATES;

DEFECT DENSITY; DOPANTS; NANOWIRE; XSTM;

NANOSTRUCTURED MATERIALS;

EID: 33744546661     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/11/S22     Document Type: Article

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