Electrical transport characteristic of carbon nanotube after mass-separated ultra-low-energy oxygen ion beams irradiation

Applied Surface Science

Volumn 252, Issue 15, 2006, Pages 5579-5582

  Yamamoto, Kazuhiro ^a,c   Kamimura, Takafumi ^b,c   Matsumoto, Kazuhiko ^a,b,c  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b OSAKA UNIVERSITY   (Japan)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Carbon nanotube; CNT FET; Doping; Ion implantation; Low energy ion beam; SWCNT

Indexed keywords

DOPING (ADDITIVES); ION BEAMS; IRRADIATION; PRESSURE EFFECTS; VACUUM;

CNT-FET; DISPLACEMENT ENERGY; LOW-ENERGY ION BEAM; SWCNT;

CARBON NANOTUBES;

EID: 33744521357     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.12.141     Document Type: Article

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