On statistical timing analysis with inter- and intra-die variations

Proceedings -Design, Automation and Test in Europe, DATE '05

Volumn I, Issue , 2005, Pages 132-137

  Mangassarian, Hratch ^a   Anis, Mohab ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARKING; CORRELATION THEORY; MICROPROCESSOR CHIPS; PROBABILITY DENSITY FUNCTION; PROGRAM PROCESSORS; RANDOM PROCESSES; VLSI CIRCUITS;

CRITICAL PATHS; RANDOM VARIABLES; SPATIAL CORRELATIONS; STATISTICAL TIMING ANALYSIS;

STATISTICAL METHODS;

EID: 33646920106     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2005.226     Document Type: Conference Paper

References (15)

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