Nanocrystal and interface defects related photoluminescence in silicon-rich Al2O3 films

Journal of Luminescence

Volumn 121, Issue 1, 2006, Pages 95-101

  Bi, L ^a   Feng, J Y ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

Interface defects; Nanocrystal; Photoluminescence

Indexed keywords

ALUMINUM COMPOUNDS; ANNEALING; ELECTRON EMISSION; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; PHOTOLUMINESCENCE;

INTERFACE DEFECTS; NANOCRYSTAL; OXYGEN ATMOSPHERE; VIBRATIONAL EMISSIONS;

THIN FILMS;

EID: 33646829467     PISSN: 00222313     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jlumin.2005.10.007     Document Type: Article

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