Selective specimen preparation for TEM observation of the cross-section of individual carbon nanotube/metal junctions

Ultramicroscopy

Volumn 85, Issue 2, 2000, Pages 93-98

  Wei, Bingqing ^a   Kohler Redlich, Philipp ^a   Bäder, Ute ^a   Heiland, Birgit ^a   Spolenak, Ralph ^a   Arzt, Eduard ^a   Rühle, Manfred ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

Carbon nanotube; Cross section; Focused ion beam (FIB); High resolution transmission electron microscopy; Specimen preparation

Indexed keywords

CARBON; ION BEAMS; NANOTUBES; SILICA; SILICON WAFERS; SPECIMEN PREPARATION; TUNGSTEN;

CARBON NANOTUBES; FOCUSED ION BEAMS (FIB);

TRANSMISSION ELECTRON MICROSCOPY;

METAL; NANOPARTICLE;

ARTICLE; IMAGE RECONSTRUCTION; OBSERVATION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0034307906     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(00)00040-1     Document Type: Article

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