Characterization of surface and interface structure of YBa2 Cu3O7-δ -based trilayer with La 0.67Ca0.33 MnO3 spacer

Journal of Applied Physics

Volumn 99, Issue 8, 2006, Pages

  Tan, W S ^a,b   Cai, H L ^a   Liu, J S ^a   Wu, X S ^a   Jiang, S S ^a   Wu, Z H ^c   Jia, Q J ^c   Gao, J ^d  

^a NANJING UNIVERSITY   (China)

^b NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^c INSTITUTE OF HIGH ENERGY PHYSICS   (China)

^d UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MAGNETRON SPUTTERING; SURFACE ROUGHNESS; X RAY DIFFRACTION; YTTRIUM BARIUM COPPER OXIDES;

DIFFUSION LENGTH; INTERFACE STRUCTURE; STRAIN RELAXATION; TRILAYERS;

THIN FILMS;

EID: 33646749669     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2176319     Document Type: Article

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