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Journal of Alloys and Compounds

Volumn 251, Issue 1-2, 1997, Pages 83-86

Glancing incidence X-ray characterization of ultrathin YBa2Cu3O7-x films fabricated by modulated magnetron sputtering

(4) Del Vecchio, A a,b Tapfer, L a Camerlingo, C c Russo, M c

a Centro Nazionale per la Ricerca e lo Sviluppo dei Materiali (Italy)

b INFM (Italy)

c Inst Biochem Protein and Enzymol (Italy)

Author keywords

Modulated magnetron sputtering; Ultrathin YBa2Cu3O7 x films

Indexed keywords

ATOMIC FORCE MICROSCOPY; FILM GROWTH; HIGH TEMPERATURE SUPERCONDUCTORS; MAGNETRON SPUTTERING; OXIDE SUPERCONDUCTORS; PHASE INTERFACES; STRONTIUM COMPOUNDS; SUBSTRATES; SURFACE ROUGHNESS; ULTRATHIN FILMS; X RAY CRYSTALLOGRAPHY; YTTRIUM COMPOUNDS;

GLANCING INCIDENCE X RAY ANALYSIS; HIGH ANGLE X RAY DIFFRACTION; LOW ANGLE SPECULAR REFLECTIVITY; YTTRIUM BARIUM COPPER OXIDES;

SUPERCONDUCTING FILMS;

EID: 0031119963 PISSN: 09258388 EISSN: None Source Type: Journal
DOI: 10.1016/S0925-8388(96)02771-5 Document Type: Article

Times cited : (2)

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