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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 3, 2003, Pages 1395-1399

X-ray reflectivity study of interdiffusion at YBa2Cu3O7-x and metal interfaces

(7) Han, S W a,d Tripathy, S a Miceli, P F a Badica, E b Covington, M b Greene, L H b Aprili, M c

a UNIVERSITY OF MISSOURI (United States)

b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN (United States)

c CNRS (France)

d LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

Author keywords

Interdiffusion; Interface; Reflectivity; Superconductor; Surface; Thin film; X ray; YBCO

Indexed keywords

EVAPORATION; INTERDIFFUSION (SOLIDS); INTERFACES (MATERIALS); SPUTTER DEPOSITION; THIN FILMS; X RAY ANALYSIS;

X RAY REFLECTION;

YTTRIUM BARIUM COPPER OXIDES;

EID: 0037953125 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.42.1395 Document Type: Article

Times cited : (10)

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