Test planning and test resource optimization For droplet-based microfluidic systems

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 22, Issue 2, 2006, Pages 199-210

  Su, Fei ^a,b   Ozev, Sule ^a   Chakrabarty, Krishnendu ^a,c,d,e,f  

^a Duke University   (United States)

^b DUKE UNIVERSITY   (United States)

^c IEEE   (United States)

^d ACM   (United States)

^e ACM SIGDA   (United States)

^f ACM SIGDA ^*  (United States)

Author keywords

Concurrent testing; Droplet based microfluidic systems; Microfluidic arrays; Test planning; Test resource optimization

Indexed keywords

CONCURRENT TESTING; DROPLET-BASED MICROFLUIDIC SYSTEMS; MICROFLUIDIC ARRAYS; TEST PLANNING; TEST RESOURCE OPTIMIZATION;

COMPUTATIONAL COMPLEXITY; INTEGER PROGRAMMING; LINEAR PROGRAMMING; OPTIMIZATION; PROBLEM SOLVING; RELIABILITY; RESOURCE ALLOCATION;

MICROELECTROMECHANICAL DEVICES;

EID: 33646744418     PISSN: 09238174     EISSN: 15730727     Source Type: Journal    
DOI: 10.1007/s10836-005-1256-3     Document Type: Review

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