Magnetic domains and magnetization reversal of ion-induced magnetically patterned Ruderman-Kittel-Kasuya-Yoshida-coupled Ni 81Fe 19/Ru/Co 90Fe 10 films

Journal of Applied Physics

Volumn 99, Issue 8, 2006, Pages

  Fassbender, J ^a   Bischoff, L ^a   Mattheis, R ^b   Fischer, P ^c  

^a INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^b LEIBNIZ INSTITUTE OF PHOTONIC TECHNOLOGY   (Germany)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARTIFICIAL STRUCTURES; FILM TOPOGRAPHY; MAGNETIC PATTERNING; X-RAY MICROSCOPY;

ION BEAMS; MAGNETIC DOMAINS; MAGNETIC THIN FILMS; MAGNETIZATION; MICROSTRUCTURE; X RAY ANALYSIS;

NICKEL COMPOUNDS;

EID: 33646727945     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2158967     Document Type: Article

References (22)

1. C. Chappert, Science 280, 1919 (1998).
2. J. Fassbender, D. Ravelosona, and Y. Samson, J. Phys. D 37, R179 (2004).
3. T. Devolder, C. Chappert, Y. Chen, E. Cambril, H. Bernas, J. P. Jamet, and J. Ferre, Appl. Phys. Lett. 74, 3383 (1999).
4. B. D. Terris, L. Folks, D. Weller, J. E. E. Baglin, A. J. Kellock, H. Rothuizen, and P. Vettiger, Appl. Phys. Lett. 75, 403 (1999).
5. J. Lohau, A. Moster, C. T. Rettner, M. E. Best, and B. D. Terris, Appl. Phys. Lett. 78, 990 (2001).
6. M. Albrecht, C. T. Rettner, A. Moser, M. E. Best, and B. D. Terris, Appl. Phys. Lett. 81, 2875 (2002).
7. S. I. Woods, S. Ingvarsson, J. R. Kirtley, H. F. Hamann, and R. H. Koch, Appl. Phys. Lett. 81, 1276 (2002).
8. D. Ozkaya, R. M. Langford, W. L. Chan, and A. K. Petford-Long, J. Appl. Phys. 91, 9937 (2002).
9. J. McCord, T. Gemming, L. Schultz, J. Fassbender, M. O. Liedke, M. Frommberger, and E. Quandt, Appl. Phys. Lett. 86, 162502 (2005).
10. D. McGrouther and J. N. Chapman, Appl. Phys. Lett. 87, 022507 (2005).
11. A. Mougin, J. Appl. Phys. 89, 6606 (2001).
12. J. Fassbender, Phys. Status Solidi A 189, 439 (2002).
13. J. McCord, J. Appl. Phys. 97, 10K102 (2005).
14. K. Potzger, L. Bischoff, M. O. Liedke, B. Hillebrands, M. Rickart, P. P. Freitas, J. McCord, and J. Fassbender, IEEE Trans. Magn. 41, 3610 (2005).
15. S. O. Demokritov, Phys. Rev. Lett. 90, 097201 (2003).
16. V. E. Demidov, D. I. Kholin, S. O. Demokritov, B. Hillebrands, F. Wegelin, and J. Marien, Appl. Phys. Lett. 84, 2853 (2004).
17. J. Fassbender, F. C. Nörtemann, R. L. Stamps, R. E. Camley, B. Hillebrands, G. Güntherodt, and S. S. P. Parkin, Phys. Rev. B 46, 5810 (1992).
18. L. Bischoff, Ultramicroscopy 103, 59 (2005).
19. J. F. Ziegler, SRIM 2003 code, IBM, White Plains, NY, 2003; J. F. Ziegler, J. P. Biersack, and U. Littmark, The Stopping and Range of Ions in Solids (Pergamon, New York, 1985).
20. J. F. Ziegler, SRIM 2003 code, IBM, White Plains, NY, 2003; J. F. Ziegler, J. P. Biersack, and U. Littmark, The Stopping and Range of Ions in Solids (Pergamon, New York, 1985).
21. P. Fischer, Rev. Sci. Instrum. 72, 2322 (2001).
22. W. Chao, B. D. Harteneck, J. A. Liddle, E. H. Anderson, and D. T. Attwood, Nature (London) 435, 1210 (2005).