Simultaneous measurement of the piezoelectric and dielectric response of nanoscale ferroelectric capacitors by an atomic force microscopy based approach

Applied Physics A: Materials Science and Processing

Volumn 84, Issue 1-2, 2006, Pages 67-71

  Petraru, A ^a   Nagarajan, V ^b   Kohlstedt, H ^a,c   Ramesh, R ^c   Schlom, D G ^d   Waser, R ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b UNIVERSITY OF NEW SOUTH WALES   (Australia)

^c University of California Berkeley   (United States)

^d PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIELECTRIC PROPERTIES; FERROELECTRICITY; NANOSTRUCTURED MATERIALS; PIEZOELECTRICITY;

FERROELECTRIC CAPACITORS; NANOCAPACITORS; PIEZORESPONSE;

CAPACITORS;

EID: 33646712594     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-006-3592-2     Document Type: Article

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