Domain structure study of SrBi2Ta2O9 ferroelectric thin films by scanning capacitance microscopy

Applied Physics Letters

Volumn 82, Issue 20, 2003, Pages 3493-3495

  Leu, Ching Chich ^a   Chen, Chih Yuan ^a   Chien, Chao Hsin ^a   Chang, Mao Nan ^a   Hsu, Fan Yi ^b   Hu, Chen Ti ^b  

^a NATIONAL NANO DEVICE LABORATORIES   (Taiwan)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; ELECTROMAGNETIC WAVE POLARIZATION; FERROELECTRICITY; IMAGE ANALYSIS; MICROSCOPIC EXAMINATION; STRONTIUM COMPOUNDS;

IMAGE CONTRAST;

FERROELECTRIC THIN FILMS;

EID: 0037981517     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1576308     Document Type: Article

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