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Volumn 42, Issue 10, 2006, Pages 603-604

Self-gating controlled pronounced threshold hysteresis in electron Y-branch switch with quantum dots

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CHARGE; ELECTRIC POTENTIAL; HYSTERESIS; SEMICONDUCTOR JUNCTIONS;

EID: 33646704015     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20060312     Document Type: Article
Times cited : (1)

References (8)
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    • (1997) Science , vol.275 , pp. 649-651
    • Guo, L.J.1    Leobandung, E.2    Chou, S.Y.3
  • 2
    • 0001011675 scopus 로고    scopus 로고
    • Simulation of a quantum-dot flash memory
    • Iannaccone, G., Trellakis, A., and Ravaioli, U.: ' Simulation of a quantum-dot flash memory ', J. Appl. Phys., 1998, 84, p. 5032-5036
    • (1998) J. Appl. Phys. , vol.84 , pp. 5032-5036
    • Iannaccone, G.1    Trellakis, A.2    Ravaioli, U.3
  • 3
    • 0035878258 scopus 로고    scopus 로고
    • Memory operation of silicon quantum-dot floating-gate metal-oxide-semiconductor field-effect transistors
    • Kohno, A., Murakami, H., Ikeda, M., Miyazaki, S., and Hirose, M.: ' Memory operation of silicon quantum-dot floating-gate metal-oxide-semiconductor field-effect transistors ', Jpn. J. Appl. Phys., 2001, 40, p. L721-L723
    • (2001) Jpn. J. Appl. Phys. , vol.40
    • Kohno, A.1    Murakami, H.2    Ikeda, M.3    Miyazaki, S.4    Hirose, M.5
  • 4
    • 0042362124 scopus 로고    scopus 로고
    • Multiple-step electron charging in silicon-quantum-dot floating gate metal-oxide-semiconductor memories
    • Ikeda, M., Shimizu, Y., Murakami, H., and Miyazaki, S.: ' Multiple-step electron charging in silicon-quantum-dot floating gate metal-oxide-semiconductor memories ', Jpn. J. Appl. Phys., 2003, 42, p. 4134-4137
    • (2003) Jpn. J. Appl. Phys. , vol.42 , pp. 4134-4137
    • Ikeda, M.1    Shimizu, Y.2    Murakami, H.3    Miyazaki, S.4
  • 5
    • 0035280102 scopus 로고    scopus 로고
    • 3-D computer simulation of single-electron charging in silicon nanocrystal floating gate flash memory devices
    • Thean, A., and Leburton, J.P.: ' 3-D computer simulation of single-electron charging in silicon nanocrystal floating gate flash memory devices ', IEEE Electron Device Lett., 2001, 22, p. 148-150
    • (2001) IEEE Electron Device Lett. , vol.22 , pp. 148-150
    • Thean, A.1    Leburton, J.P.2
  • 6
    • 0041409629 scopus 로고    scopus 로고
    • Memory characterization of SiGe quantum dot flash memories with HfO2 and SiO2 tunneling dielectrics
    • Kim, D.W., Kim, T., and Benerjee, S.K.: ' Memory characterization of SiGe quantum dot flash memories with HfO2 and SiO2 tunneling dielectrics ', IEEE Trans. Electron Devices, 2003, 50, p. 1823-1829
    • (2003) IEEE Trans. Electron Devices , vol.50 , pp. 1823-1829
    • Kim, D.W.1    Kim, T.2    Benerjee, S.K.3
  • 7
    • 0032614415 scopus 로고    scopus 로고
    • Self-gating effect in the electron Y-branch switch
    • Wesström, J.-O.J.: ' Self-gating effect in the electron Y-branch switch ', Phys. Rev. Lett., 1999, 82, p. 2564-2567
    • (1999) Phys. Rev. Lett. , vol.82 , pp. 2564-2567
    • Wesström, J.-O.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.