-
2
-
-
79956054356
-
-
Y. L. Loo, R. L. Willet, K. W. Baldwin, J. A. Rogers, Appl. Phys. Lett. 2002, 81, 562.
-
(2002)
Appl. Phys. Lett.
, vol.81
, pp. 562
-
-
Loo, Y.L.1
Willet, R.L.2
Baldwin, K.W.3
Rogers, J.A.4
-
3
-
-
0006152631
-
-
J. Chen, M. A. Reed, C. L. Asplund, A. M. Cassell, M. L. Myrick, A. M. Rawlett, J. M. Tour, P. G. van Patten, Appl. Phys. Lett. 1999, 75, 624.
-
(1999)
Appl. Phys. Lett.
, vol.75
, pp. 624
-
-
Chen, J.1
Reed, M.A.2
Asplund, C.L.3
Cassell, A.M.4
Myrick, M.L.5
Rawlett, A.M.6
Tour, J.M.7
Van Patten, P.G.8
-
4
-
-
0033614026
-
-
R. D. Piner, J. Zhu, F. Xu, S. H. Hong, C. A. Mirkin, Science 1999, 283, 661.
-
(1999)
Science
, vol.283
, pp. 661
-
-
Piner, R.D.1
Zhu, J.2
Xu, F.3
Hong, S.H.4
Mirkin, C.A.5
-
5
-
-
0033940113
-
-
G.-Y. Liu, S. Xu, Y. L. Qian, Acc. Chem. Res. 2000, 33, 457.
-
(2000)
Acc. Chem. Res.
, vol.33
, pp. 457
-
-
Liu, G.-Y.1
Xu, S.2
Qian, Y.L.3
-
7
-
-
27244455531
-
-
J. C. Hulteen, R. P. Van Duyne. J. Vac. Sci. Technol., B: Microeleciron. Nanometer Struct. - Process., Meas., Phenom. 1995, 13, 1553.
-
(1995)
J. Vac. Sci. Technol., B: Microeleciron. Nanometer Struct. - Process., Meas., Phenom.
, vol.13
, pp. 1553
-
-
Hulteen, J.C.1
Van Duyne, R.P.2
-
8
-
-
0001075549
-
-
M. J. Lercel, G. F. Redinbo, F. D. Pardo, M. Rooks, R. C. Tiberio, P. Simpson, H. G. Craighead, C. W. Sheen, A. N. Parikh, D. L. Allara, J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct. - Process., Meas., Phenom. 1994, 12, 3663.
-
(1994)
J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct. - Process., Meas., Phenom.
, vol.12
, pp. 3663
-
-
Lercel, M.J.1
Redinbo, G.F.2
Pardo, F.D.3
Rooks, M.4
Tiberio, R.C.5
Simpson, P.6
Craighead, H.G.7
Sheen, C.W.8
Parikh, A.N.9
Allara, D.L.10
-
9
-
-
0001587868
-
-
S. Friebel, J. Aizenberg, S. Abad, P. Wiltzius, Appl. Phys. Lett. 2000, 77, 2406.
-
(2000)
Appl. Phys. Lett.
, vol.77
, pp. 2406
-
-
Friebel, S.1
Aizenberg, J.2
Abad, S.3
Wiltzius, P.4
-
10
-
-
85080852501
-
-
A. Gölzhäuser, W. Eck, W. Geyer, V. Stadler, T. Weimann, P. Hinze, M. Grunze, Adv. Mater. 2001, 13, 806.
-
(2001)
Adv. Mater.
, vol.13
, pp. 806
-
-
Gölzhäuser, A.1
Eck, W.2
Geyer, W.3
Stadler, V.4
Weimann, T.5
Hinze, P.6
Grunze, M.7
-
12
-
-
0036883154
-
-
M. E. Anderson, R. K. Smith, Z. J. Donhauser, A. Hatzor, L. P. Tan, H. Tanaka, M. W. Horn, P. S. Weiss, J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct. - Process., Meas., Phenom. 2002, 20, 2739.
-
(2002)
J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct. - Process., Meas., Phenom.
, vol.20
, pp. 2739
-
-
Anderson, M.E.1
Smith, R.K.2
Donhauser, Z.J.3
Hatzor, A.4
Tan, L.P.5
Tanaka, H.6
Horn, M.W.7
Weiss, P.S.8
-
13
-
-
0942289201
-
-
M. E. Anderson, L. P. Tan, H. Tanaka, M. Mihok, H. Lee, M. W. Horn, P. S. Weiss, J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct. - Process., Meas., Phenom. 2003, 21, 3116.
-
(2003)
J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct. - Process., Meas., Phenom.
, vol.21
, pp. 3116
-
-
Anderson, M.E.1
Tan, L.P.2
Tanaka, H.3
Mihok, M.4
Lee, H.5
Horn, M.W.6
Weiss, P.S.7
-
15
-
-
4644324544
-
-
H. Tanaka, M. E. Anderson, M. W. Horn, P. S. Weiss, Jpn. J. Appl. Phys., Part 2 2004, 43, L950.
-
(2004)
Jpn. J. Appl. Phys., Part 2
, vol.43
-
-
Tanaka, H.1
Anderson, M.E.2
Horn, M.W.3
Weiss, P.S.4
-
16
-
-
0004941035
-
-
S. D. Evans, A. Ulman, K. E. Goppert-Berarducci, J. L. Gerenser, J. Am. Chem. Soc. 1991, 113, 5866.
-
(1991)
J. Am. Chem. Soc.
, vol.113
, pp. 5866
-
-
Evans, S.D.1
Ulman, A.2
Goppert-Berarducci, K.E.3
Gerenser, J.L.4
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