Effect of low pressure remote plasma treatment on damage reduction of emitting organic layer for top-emission organic light-emitting diodes

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 45, Issue 12-16, 2006, Pages

  Lee, Deuk Yeon ^a   Baik, Hong Koo ^a  

^a Yonsei University   (South Korea)

Author keywords

Continuous layer growth; Low pressure remote plasma; Polymer damage; Surface energy; Top emission organic light emitting diodes

Indexed keywords

EXPLOSIVES; INTERFACIAL ENERGY; LAYERED MANUFACTURING; NEGATIVE IONS; PLASMA APPLICATIONS; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTING ORGANIC COMPOUNDS; SPUTTERING;

CONTINUOUS LAYER GROWTH; LOW PRESSURE REMOTE PLASMA; POLYMER DAMAGE; TOP-EMISSION ORGANIC LIGHT-EMITTING DIODES (TEOLEDS);

LIGHT EMITTING DIODES;

EID: 33646471286     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.L376     Document Type: Article

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