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Volumn 86, Issue 18, 2005, Pages 1-3

Plasma damage-free sputtering of indium tin oxide cathode layers for top-emitting organic light-emitting diodes

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CATHODES; LEAKAGE CURRENTS; LIGHT EMITTING DIODES; MAGNETRON SPUTTERING; MIRRORS; PLASMA APPLICATIONS; SCANNING ELECTRON MICROSCOPY; SPUTTER DEPOSITION; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 20844458737     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1923182     Document Type: Article
Times cited : (132)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.