메뉴 건너뛰기




Volumn 3728 LNCS, Issue , 2005, Pages 237-246

Optimization of reliability and power consumption in systems on a chip

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POWER SYSTEM INTERCONNECTION; ENERGY CONSERVATION; MICROPROCESSOR CHIPS; RELIABILITY; TRANSISTORS;

EID: 33646451678     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/11556930_25     Document Type: Conference Paper
Times cited : (14)

References (23)
  • 1
    • 0017983601 scopus 로고
    • Performance-related reliability measures for computing systems
    • June 6
    • M. D. Beaudry. Performance-related reliability measures for computing systems. IEEE Trans. on Comp., c-27:540(6), June 1978.
    • (1978) IEEE Trans. on Comp. , vol.C-27 , pp. 540
    • Beaudry, M.D.1
  • 4
    • 1342336783 scopus 로고    scopus 로고
    • Dynamic power management in a mobile multimedia system with guaranteed quality-of-service
    • Q. Qiu, Q. Wu, M. Pedram, "Dynamic Power Management in a Mobile Multimedia System with Guaranteed Quality-of-Service," Design Automation Conference, pp. 701-707, 2001.
    • (2001) Design Automation Conference , pp. 701-707
    • Qiu, Q.1    Wu, Q.2    Pedram, M.3
  • 6
    • 0002232376 scopus 로고    scopus 로고
    • Ar/smt: A microarchitectural approach to fault tolerance in microprocessors
    • E. Rotenberg. Ar/smt: A microarchitectural approach to fault tolerance in microprocessors, Intl. Symp. on Fault Tolerant Comp, 1998.
    • (1998) Intl. Symp. on Fault Tolerant Comp
    • Rotenberg, E.1
  • 9
    • 13944252448 scopus 로고    scopus 로고
    • The impact of technology scaling on processor lifetime reliability
    • December
    • J. Srinivasan, P. Bose, J.Rivers, "The impact of Technology Scaling on Processor Lifetime Reliability," UIUC CS Technical Report, December 2003
    • (2003) UIUC CS Technical Report
    • Srinivasan, J.1    Bose, P.2    Rivers, J.3
  • 13
    • 0034211118 scopus 로고    scopus 로고
    • Thin film cracking and rathcheting caused by temperature cycling
    • Jun 4
    • M. Huang, Z. Suo, "Thin film cracking and rathcheting caused by temperature cycling", J. Mater. Res. v.15, n..6, pp. 1239 (4), Jun 2000.
    • (2000) J. Mater. Res. , vol.15 , Issue.6 , pp. 1239
    • Huang, M.1    Suo, Z.2
  • 14
    • 0032003014 scopus 로고    scopus 로고
    • A new model for the field dependence of intristic and extrinsic time-dependent dielectric breakdown
    • 472(10), Feb.
    • R. Degraeve, J.L. Ogier, et. al, "A New Model for the Field Dependence of Intristic and Extrinsic Time-Dependent Dielectric Breakdown", IEEE Trans. on Elect. Devices, 472(10),v.45,n.2, Feb. 1998
    • (1998) IEEE Trans. on Elect. Devices , vol.45 , Issue.2
    • Degraeve, R.1    Ogier, J.L.2
  • 18
    • 33646463226 scopus 로고    scopus 로고
    • SAF7113H datasheet
    • March
    • "SAF7113H datasheet", Philips Semiconductors, March 2004
    • (2004) Philips Semiconductors
  • 19
    • 33646459255 scopus 로고    scopus 로고
    • SST-melody-DAP audio processor
    • "SST-Melody-DAP Audio Processor", Analog Devices, 2002.
    • (2002) Analog Devices
  • 20
    • 84858874238 scopus 로고    scopus 로고
    • MSP430×11×2, MSP430×12×2 mixed signal microcontroller
    • August
    • "MSP430×11×2, MSP430×12×2 Mixed Signal Microcontroller", Texas Instruments, August 2004.
    • (2004) Texas Instruments
  • 21
    • 33646444508 scopus 로고    scopus 로고
    • Rambus, July
    • "RDRAM 512Mb", Rambus, July 2003.
    • (2003) RDRAM 512Mb


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.