Heteroepitaxy of CdTe on tilting Si(2 1 1) substrates by molecular beam epitaxy

Journal of Crystal Growth

Volumn 290, Issue 2, 2006, Pages 436-440

  Wang, Yuan Zhang ^a,b   Chen, Lu ^a   Wu, Yan ^a   Wu, Jun ^a   Yu, Mei Fang ^a   He, Li ^a  

^a SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

^b INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

A1. High resolution X ray diffraction; A1. Shear strain; A3. Molecular beam epitaxy; B1. CdTe; B1. Si

Indexed keywords

CADMIUM COMPOUNDS; CRYSTALLINE MATERIALS; MOLECULAR BEAM EPITAXY; X RAY DIFFRACTION;

CDTE; HIGH RESOLUTION X-RAY DIFFRACTION; SHEAR STRAIN; WAFER MAPPING;

EPITAXIAL GROWTH;

EID: 33646343757     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2006.01.048     Document Type: Article

References (16)

1. Varesi J.B., Bornfreund R.E., Childs A.C., Radford W.A., Maranowski K.D., Peterson J.M., Johnson S.M., Giegerich L.M., de Lyon T.J., and Jensen J.E. J. Electron. Mater. 30 (2001) 559
2. Maranowski K.D., Peterson J.M., Johnson S.M., Varesi J.B., Childs A.C., Bornfreund R.E., Buell A.A., Radford W.A., de Lyon T.J., and Jensen J.E. J. Electron. Mater. 30 (2001) 619
3. de Lyon T.J., Rajavel D., Johnson S.M., and Cockrum C.A. Appl. Phys. Lett. 66 (1995) 2119
4. Rujirawat S., Smith D.J., Faurie J.P., Neu G., Nathan V., and Sivananthan S. J. Electron. Mater. 27 (1998) 1047
5. Wang Y.-Z.., Chen L., Wu Y., Wu J., Yu M.-F., Fang W.-Z., and He L. J. Synth. Cryst. 34 (2005) 649
6. Chen Y.P., Faurie J.P., Sivananthan S., Hua G.C., and Otsuka N. J. Electron. Mater. 24 (1995) 475
7. Million A., Dhar N.K., and Dinan J.H. J. Crystal Growth 159 (1996) 76
8. De Caro L., and Tapfer L. Phys. Rev. B 48 (1993) 2298
9. Ishizaka A., and Shiraki Y. J. Electrochem. Soc. 133 (1986) 666
10. Chen L., Wang Y.Z., Wu Y., Wu J., Yu M.F., Qiao Y.M., and He L. Proc. SPIE 5640 (2004) 684
11. Xin Y., Rujirawat S., Browning N.D., Sporken R., Sivananthan S., Pennycook S.J., and Dhar N.K. Appl. Phys. Lett. 75 (1999) 349
12. Zavitz D.H., Evstigneeva A., Singh R., Fulk C., and Trenary M. J. Electron. Mater. 34 (2005) 839
13. Fulk C., Sporken R., Dumont J., Zavitz D., Trenary M., Gupta B., Brill G., Dinan J., and Sivananthan S. J. Electron. Mater. 34 (2005) 846
14. Fewster P.F. J. Appl. Crystallogr. 22 (1989) 64
15. Fewster P.F., and Andrew N.L. Thin Solid Films 319 (1998) 1
16. Williams M.G., Tomlinson R.D., and Hampshire M.J. Solid State Commun. 7 (1969) 1831